Morphological Analysis and Its Applications in Materials Science and Engineering

Michael Glazoff
Idaho National Laboratory
Advanced Process and Decision Systems


Morphological analysis and synthesis operations were employed for understanding microstructure transformations and evolution for a number of materials science problems:

     1. the application of charge/discharge cycles to electrochemical storage systems (batteries);
     2. Morphology based metallic surface characterization (metrology);
     3. Fracture surface analyses and decomposition into brittle and ductile failure;
     4. Defect identification for material components,
and many others.

     Using the patented state-of-the-art morphological algorithms and platform, the MorphoHawk (TM) , it becomes possible to predict and analyze microstructure evolution and transformations using this original mathematical approach. The developed techniques could be considered supplementary to a phase-field mesoscopic approach to microstructure evolution that is based upon clear and definitive changes in the appearance of microstructure. However, unlike in phase-field, the governing equations for the morphological approach are geometry-, not physics-based. A similar non-physics based approach to understanding different phenomena was attempted with the introduction of cellular automata. It is anticipated that morphological synthesis will represent a useful supplementary tool to phase-field and will render assistance to unraveling the underlying microstructure-property relationships.
Morphological Images
Three-dimensional (3D) representation of the surface height function f(x, y) for original rolled and formed aluminum alloy, AA6022. Total surface height function (a) and its morphological decomposition into OP (“orange peel”, or grain roughening) (b), and RGI (roll-grin imprint) (c) components. The size of the imaged area is 1.2*1.2 mm2. M.V. Glazoff et al.,  Interplay Between Plastic Deformations and Optical Properties of Metal Surfaces: a Multiscale Study, Applied Physics Letters,  volume 95, issue 8, article 084106 (August 24, 2009)