Three-Dimensional Defect Structures Characterized Via X-Ray
Dr. Branton Campbell
Dept. of Physics and Astronomy
Brigham Young University
Many of the interesting physical properties of crystalline materials are
dominated by deviations from ideal crystallinity (i.e. defects), which are
defined by nanoscale correlations rather than long-range order. While
local correlations cannot be characterized via traditional "diffraction"
methods, recent advances in x-ray source brightness, detector technology
and computational power now make it possible to probe their "diffuse" scattering
distributions. These three-dimensional diffuse scattering patterns
often have real aesthetic beauty, while also encoding the local atomic structure.
After building a conceptual framework, I will highlight several complex defect
architectures recently discovered in the microporous alumino-silicates, high-temperature
superconductors, colossal magnetoresistors and piezoelectric relaxor materials.